David C. Joy
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Helium Ion Microscopy: Principles and Applications (SpringerBriefs in Materials)
Monte Carlo Modeling for Electron Microscopy and Microanalysis (Oxford Series in Optical and Imaging Sciences, 9)
Helium Ion Microscopy: Principles and Applications (SpringerBriefs in Materials)
Monte Carlo Modeling for Electron Microscopy and Microanalysis
Subaltern Historiography: A Reader
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